Quality:

Logic built-in self-test - form of built-in self-test in which hardware and/or software is built into integrated circuits allowing operational self-check, as opposed to reliance on external automated test equipment. Article “Logic built-in self-test” in English Wikipedia has 8.1 points for quality (as of July 1, 2025).
The article contains 0 references and 5 sections.
Since the creation of article “Logic built-in self-test”, its content was written by 17 registered users of English Wikipedia and edited by 17 registered Wikipedia users in all languages.
The article is cited 5 times in English Wikipedia and cited 5 times in all languages.
The highest Authors Interest rank from 2001:
- Local (English): #141488 in January 2009
- Global: #355390 in January 2009
The highest popularity rank from 2008:
- Local (English): #893563 in July 2014
- Global: #1551635 in July 2014
There is 1 language version for this article in the WikiRank database (of the considered 55 Wikipedia language editions).
The quality and popularity assessment was based on Wikipédia dumps from July 1, 2025 (including revision history and pageviews for previous years).